The structural sensitivity of electron energy-loss near-edge structure (ELNES)

John Spence

doi:10.1016/0304-3991(85)90134-2

The structural sensitivity of electron energy-loss near-edge structure (ELNES)

John Spence

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Abstract

Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.

Original language	English (US)
Pages (from-to)	165-172
Number of pages	8
Journal	Ultramicroscopy
Volume	18
Issue number	1-4
DOIs	https://doi.org/10.1016/0304-3991(85)90134-2
State	Published - 1985

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(85)90134-2

Cite this

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title = "The structural sensitivity of electron energy-loss near-edge structure (ELNES)",

abstract = "Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.",

author = "John Spence",

note = "Funding Information: I am grateful to Drs. D. Saldin and P. Durham for advice on the use of the multiple scattering programs, to Dr. C. Ahn for providing a Be foil, and to Dr. M. Disko for many things in recent years. This work was supported by ARO grant DAAG 29-83-K-0087 and the facilities of the NSF National Center for Electron Microscopy at ASU.",

year = "1985",

doi = "10.1016/0304-3991(85)90134-2",

language = "English (US)",

volume = "18",

pages = "165--172",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

number = "1-4",

}

TY - JOUR

T1 - The structural sensitivity of electron energy-loss near-edge structure (ELNES)

AU - Spence, John

N1 - Funding Information: I am grateful to Drs. D. Saldin and P. Durham for advice on the use of the multiple scattering programs, to Dr. C. Ahn for providing a Be foil, and to Dr. M. Disko for many things in recent years. This work was supported by ARO grant DAAG 29-83-K-0087 and the facilities of the NSF National Center for Electron Microscopy at ASU.

PY - 1985

Y1 - 1985

N2 - Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.

AB - Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.

UR - https://www.scopus.com/pages/publications/0022219404

UR - https://www.scopus.com/pages/publications/0022219404#tab=citedBy

U2 - 10.1016/0304-3991(85)90134-2

DO - 10.1016/0304-3991(85)90134-2

M3 - Article

SN - 0304-3991

VL - 18

SP - 165

EP - 172

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1-4

ER -

The structural sensitivity of electron energy-loss near-edge structure (ELNES)

Abstract

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