Abstract
The timing characteristics of a planar Cd1-xZnxTe sample at each frequency of a scanning square-wave test pattern, has been measured. This study is aimed at evaluating the speed characteristics of a Cd1-xZnxTe detector for X-ray imaging and computed tomographic (CT) applications. The experimental results of this study indicate that the temporal response of a Cd1-xZnxTe detector based X-ray system, improves significantly by optimizing the X-ray tube and detector parameters.
Original language | English (US) |
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Pages (from-to) | 909-914 |
Number of pages | 6 |
Journal | Unknown Journal |
Volume | 48 |
Issue number | 5 |
DOIs | |
State | Published - 1999 |
Externally published | Yes |
ASJC Scopus subject areas
- Instrumentation
- Electrical and Electronic Engineering