Keyphrases
Removal Rate
100%
Chemical Mechanical Planarization
100%
Rate-based
100%
Ultra-rapid
100%
Rapid Determination
100%
Material Removal Rate
100%
Tribology
100%
Wafer
80%
Slurry
60%
Blanket
40%
Pressure-velocity
40%
Kinetic Curves
40%
Stribeck Curve
40%
Film Thickness
20%
Strong Correlation
20%
Big Data
20%
Shear Force
20%
Relative Velocity
20%
Ultra-low
20%
Force Data
20%
Cobalt
20%
Wafer Polishing
20%
Rate Study
20%
Film Removal
20%
Material Removal
20%
Budget Approach
20%
Single Run
20%
Low Budget
20%
Pad Conditioning
20%
Thickness Metrology
20%
Engineering
Removal Rate
100%
Chemical Mechanical Polishing
100%
Material Removal Rate
100%
Relative Velocity
20%
Big Data
20%
Material Removal
20%
Shear Force
20%
Normal Force
20%
Pad Conditioning
20%
Material Science
Film Thickness
100%
Film
100%
Chemical Mechanical Planarization
100%
Cobalt
100%