TY - GEN
T1 - Ultra-Wide Bandgap Semiconductor Transistors for mm-wave Applications
AU - Joishi, Chandan
AU - Kalarickal, Nidhin Kurian
AU - Rahman, Wahidur
AU - Lu, Wu
AU - Rajan, Siddharth
N1 - Publisher Copyright: © 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - This presentation will give an overview of the current status and future opportunities for high-frequency ultrawide bandgap (UWBG) semiconductor transistors. GaN-based transistors have demonstrated excellent performance for RF applications, but are close to the limits set by their electronic properties in the mm-wave regime. UWBG semiconductors such as high Al-content AlGaN can provide significantly higher breakdown electric field while having electron saturated velocity similar to GaN, and can in principle provide significant improvements in power-gain product at mm-wave frequencies. However, key challenges in real devices such as high contact resistance, premature breakdown of metal-semiconductor and dielectric interfaces, and thermal management must be addressed before such improved performance is realized.
AB - This presentation will give an overview of the current status and future opportunities for high-frequency ultrawide bandgap (UWBG) semiconductor transistors. GaN-based transistors have demonstrated excellent performance for RF applications, but are close to the limits set by their electronic properties in the mm-wave regime. UWBG semiconductors such as high Al-content AlGaN can provide significantly higher breakdown electric field while having electron saturated velocity similar to GaN, and can in principle provide significant improvements in power-gain product at mm-wave frequencies. However, key challenges in real devices such as high contact resistance, premature breakdown of metal-semiconductor and dielectric interfaces, and thermal management must be addressed before such improved performance is realized.
UR - https://www.scopus.com/pages/publications/85137699250
UR - https://www.scopus.com/pages/publications/85137699250#tab=citedBy
U2 - 10.1109/DRC55272.2022.9855796
DO - 10.1109/DRC55272.2022.9855796
M3 - Conference contribution
T3 - Device Research Conference - Conference Digest, DRC
BT - 2022 Device Research Conference, DRC 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 Device Research Conference, DRC 2022
Y2 - 26 June 2022 through 29 June 2022
ER -