Uncertainty considerations for interferometric stability testing

Jonathan Ellis; Ki Nam Joo; Ad Verlaan; Jo Spronck; Rob Munnig Schmidt

Uncertainty considerations for interferometric stability testing

Jonathan Ellis, Ki Nam Joo, Ad Verlaan, Jo Spronck, Rob Munnig Schmidt

Optical Sciences, College of

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE
State	Published - 2008
Event	23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE - Portland, OR, United States Duration: Oct 19 2008 → Oct 24 2008

Publication series

Name	Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

Conference

Conference	23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE
Country/Territory	United States
City	Portland, OR
Period	10/19/08 → 10/24/08

ASJC Scopus subject areas

Mechanical Engineering

Cite this

Ellis, J., Joo, K. N., Verlaan, A., Spronck, J., & Schmidt, R. M. (2008). Uncertainty considerations for interferometric stability testing. In Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).

Uncertainty considerations for interferometric stability testing. / Ellis, Jonathan; Joo, Ki Nam; Verlaan, Ad et al.
Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE. 2008. (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ellis, J, Joo, KN, Verlaan, A, Spronck, J & Schmidt, RM 2008, Uncertainty considerations for interferometric stability testing. in Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE. Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE, 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE, Portland, OR, United States, 10/19/08.

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booktitle = "Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE",

note = "23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE ; Conference date: 19-10-2008 Through 24-10-2008",

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T1 - Uncertainty considerations for interferometric stability testing

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AU - Joo, Ki Nam

AU - Verlaan, Ad

AU - Spronck, Jo

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M3 - Conference contribution

SN - 9781887706483

T3 - Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

BT - Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

T2 - 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

Y2 - 19 October 2008 through 24 October 2008

ER -

Uncertainty considerations for interferometric stability testing

Publication series

Conference

ASJC Scopus subject areas

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Cite this