X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Materials Research Society Symposia Proceedings
Publisher	North-Holland
Pages	557-562
Number of pages	6
ISBN (Print)	0444009051
State	Published - Jan 1 1984
Externally published	Yes

Name	Materials Research Society Symposia Proceedings
Volume	25

ASJC Scopus subject areas

X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE. / Fathy, D.; Krivanek, O. L.; Spence, J. C.H. et al.
Materials Research Society Symposia Proceedings. North-Holland, 1984. p. 557-562 (Materials Research Society Symposia Proceedings; Vol. 25).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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title = "X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE.",

author = "D. Fathy and Krivanek, \{O. L.\} and Spence, \{J. C.H.\} and Paulson, \{W. M.\}",

year = "1984",

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AU - Paulson, W. M.

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M3 - Conference contribution

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BT - Materials Research Society Symposia Proceedings

PB - North-Holland

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